Answers Database
XC9500: How to program mulitple devices in a single chain using the HP3070 tester?
Record #3255
Product Family: Hardware
Product Line: 9500
Product Part: 9500
Problem Title:
XC9500: How to program mulitple devices in a single chain using the HP3070 tester?
Problem Description:
Urgency: Standard
General Description:
The currently available software for the HP3070 Tester does not support mulitple devices in
a single chain. Use the following procedure as a work-around
Solution 1:
Add connections from the TDO pin on each device to a tester pin. Regenerate the SVF
files for each part as follows:
For Example, if you have 3 devices in the chain, let's call them A, B and C. Let's say that A is
closest to the system TDI pin and C closest to the system TDO pin.
1. Generate the SVF file for C specifying a boundary-scan chain of 3 devices: A, B and C,
2. Generate the SVF file for B specifying a boundary-scan chain of 2 devices: A and B
3. Generate the SVF file for A specifying a boundary-scan chain of 1 devices: A
You should NOT concatenate the SVF files together because the TDO sense pin will be
different for each SVF file.
4. Run each SVF file through the translator to generate the associate VCL/PCF files.
5. Take these VCL/PCF files and compile them into an HP executable.
Run each executable under control of your testplan file as you would any normal test
operation.
End of Record #3255 - Last Modified: 12/30/97 16:15 |
