CSCI 2150
Test 3 -- Study Guide

First of all, a number of old tests with answers have been provided to help you study. When you look at these old tests, be sure to check if the topic that a particular question addresses is included in the list of topics below. Do not panic when you see a question that doesn't make sense or if you think it pertains to an earlier test.

The following is a table of the topics you will be responsible for on Test 3. Only the topics listed below will be on the test.

Topic Reading
Introduction to memory and terminology Sections 12.1 through 12.3 and 12.5
Memory hierarchy Section 13.1
Hard drives Sections 13.2 and 13.3
RAM caches Section 13.4 (Note: Tests before Spring 2005 used the direct mapping algorithm. We will be using the fully associative mapping algorithm.)
Introduction to processor architecture Sections 15.1 through 15.6
Pipelined architectures Sections 15.7
Bitwise operations Section 9.1
XOR Compare Section 9.2
Parity Section 9.3
Checksums Section 9.4
Cyclic Redundancy Check

Section 9.5 Note: Be sure you can answer questions like:

  • Why is the XOR subtraction used for the long division?
  • Why is a CRC better than a datasum-based checksum?
  • What is the general process for creating a CRC-based string?
  • What result should the receiving device get after calculating its CRC?
Serial protocols Chapter 14 Since there are not many sample questions from the old tests for serial
protocols, you may want to see problems 1 through 14 in Chapter 14 to see what you can expect on the test.